ETCompression
LogicVision's ETCompression is a deterministic test compression solution that builds upon the LogicVision's embedded logic test capabilities. ETCompression provides test time and test volume compression values equal to other 3rd party compression solutions, but also offers true at-speed launch-on-shift test application using LogicVision's patented Burst-Mode™ test timing architecture. ETCompression typically provides 100X reductions in both test time and test data volume over standard ATPG. The solution can be used stand-alone or in conjunction with the ELT random pattern test capabilities.
The automated RT level test analysis, generation and insertion flow ensures low impact to the design schedule. Test costs are reduced through shortened test times and minimal tester hardware requirements. Advantages of using Burst-Mode over competitive double-capture timing approaches include higher transition fault coverage numbers, lower pattern counts, and greater diagnosability.
The ETCompression buit-in-self-test (BIST) IP is added to a design using
LogicVision's advanced RTL automation flow. This fully hierarchical
flow ensures limited impact to the design schedule. The flow is also tightly
integrated to all major 3rd party physical design flows, including RTL-to-GDSII,
and has no impact to design performance.